Login / Signup
CMOS Testing at the End of the Roadmap: Challenges and Opportunities.
Jaume Segura
Published in:
DDECS (2006)
Keyphrases
</>
lessons learned
power consumption
open issues
technical challenges
low cost
test cases
database
information technology
high speed
real time
key issues
information systems
similarity measure
application scenarios
circuit design
computer vision
vlsi circuits