A method to leverage pre-silicon collateral and analysis for post-silicon testing and validation.
Gary MillerBandana BhattaraiYu-Chin HsuJay DuttXi ChenGeorge BakewellPublished in: DAC (2011)
Keyphrases
- high accuracy
- clustering method
- experimental evaluation
- pairwise
- computationally efficient
- statistical analysis
- cost function
- computational cost
- error rate
- detection method
- detection algorithm
- synthetic data
- high speed
- segmentation method
- significant improvement
- prior knowledge
- k means
- fully automatic
- decision trees
- classification method
- optimization method
- neural network
- mathematical analysis
- segmentation algorithm
- low cost
- artificial neural networks
- preprocessing
- computational complexity
- objective function