Fault simulation and test algorithm generation for random accessmemories.
Chi-Feng WuChih-Tsun HuangKuo-Liang ChengCheng-Wen WuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
- search space
- learning algorithm
- preprocessing
- optimization algorithm
- computational cost
- significant improvement
- np hard
- generation algorithm
- times faster
- matching algorithm
- mathematical model
- worst case
- experimental evaluation
- k means
- computational complexity
- high accuracy
- theoretical analysis
- segmentation algorithm
- detection algorithm
- ant colony optimization
- data sets
- single pass
- randomly generated
- improved algorithm
- selection algorithm
- recognition algorithm
- similarity measure
- monte carlo
- dynamic programming
- input data