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A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications.

A. SozzaChristian DuaErwan MorvanBertrand GrimbertSylvain L. Delage
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • frequency band
  • learning environment
  • test data
  • radio frequency
  • database
  • databases
  • multiscale
  • multi agent
  • mobile robot
  • daily life