Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding.
Binh X. NguyenBinh D. NguyenGustavo CarneiroErman TjiputraQuang D. TranThanh-Toan DoPublished in: CoRR (2020)
Keyphrases
- metric learning
- distance metric
- semi supervised clustering
- semi supervised
- unsupervised learning
- nearest neighbor classification
- multiple features
- multi task
- maximum variance unfolding
- distance metric learning
- learning tasks
- dimensionality reduction
- unsupervised clustering
- k means
- pairwise constraints
- nonlinear dimensionality reduction
- distance function
- pairwise
- feature space
- euclidean distance
- data sets
- semi supervised learning
- labeled data
- feature set
- text mining
- training data
- clustering algorithm
- pairwise similarities
- image processing