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Automatic test vector generation for mixed-signal circuits.

Bechir AyariNaim Ben-HamidaBozena Kaminska
Published in: ED&TC (1995)
Keyphrases
  • object oriented
  • mixed signal
  • vlsi circuits
  • low power
  • multi channel
  • digital circuits
  • high speed
  • power consumption
  • cmos technology
  • low cost
  • image restoration