Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test.
Nadun SinhabahuKatherine Shu-Min LiJian-De LiJ. R. WangSying-Jyan WangPublished in: ITC (2022)
Keyphrases
- pattern recognition
- image analysis
- signal processing
- image data
- input image
- image features
- artificial intelligence
- single image
- multiscale
- image content
- neural network
- image classification
- image retrieval
- region of interest
- moment invariants
- image representation
- high resolution
- image processing
- lighting conditions
- random noise
- pan tilt camera
- test images
- feature points
- segmentation method
- frequency domain
- expert systems
- machine learning
- high frequency
- feature vectors
- pixel values
- low frequency
- additive noise
- feature extraction
- pixel intensities
- image segmentation
- high frequency components