A graph based approach for reliability analysis of nano-scale VLSI logic circuits.

Vahid Hamiyati Vaghef Ali Peiravi

Published in: Microelectron. Reliab. (2014)

Keyphrases

reliability analysis
nano scale
logic circuits
gate array
low power
power dissipation
high speed
functional decomposition
low cost
power consumption
logic synthesis
tunnel diode
signal processing
artificial neural networks