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An oversampling method for wafer map defect pattern classification considering small and imbalanced data.

Eun-Su KimSeung-Hyun ChoiDong-Hee LeeKwang-Jae KimYoung-Mok BaeYoung-Chan Oh
Published in: Comput. Ind. Eng. (2021)
Keyphrases
  • pattern classification
  • decision boundary
  • data sets
  • neural network
  • learning algorithm
  • image processing
  • decision trees
  • similarity measure
  • pairwise
  • class imbalance
  • imbalanced data