Young-Mok Bae

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 5

Top Topics

Sequence Patterns

Manufacturing Process

Top Venues

Comput. Ind. Eng.

Adv. Eng. Informatics

J. Intell. Manuf.

Publications

Seung-Hyun Choi, Dong-Hee Lee, Eun-Su Kim, Young-Mok Bae, Young-Chan Oh, Kwang-Jae Kim
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map. Adv. Eng. Informatics 60 (2024)
Young-Mok Bae, Young-Gwan Kim, Jeong-Woo Seo, Hyun-A Kim, Chang-Ho Shin, Jeong-Hwan Son, Gyu-Ho Lee, Kwang-Jae Kim
Detecting abnormal behavior of automatic test equipment using autoencoder with event log data. Comput. Ind. Eng. 183 (2023)
Dong-Hee Lee, Eun-Su Kim, Seung-Hyun Choi, Young-Mok Bae, Jong-Bum Park, Young-Chan Oh, Kwang-Jae Kim
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods. Comput. Ind. 152 (2023)
Chang-Ho Lee, Dong-Hee Lee, Young-Mok Bae, Seung-Hyun Choi, Ki-Hun Kim, Kwang-Jae Kim
Approach to derive golden paths based on machine sequence patterns in multistage manufacturing process. J. Intell. Manuf. 33 (1) (2022)
Eun-Su Kim, Seung-Hyun Choi, Dong-Hee Lee, Kwang-Jae Kim, Young-Mok Bae, Young-Chan Oh
An oversampling method for wafer map defect pattern classification considering small and imbalanced data. Comput. Ind. Eng. 162 (2021)