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Formulations and a Computer-Aided Test Method for the Estimation of IMD Levels in an Envelope Feedback RFIC Power Amplifier.

Nicolas G. ConstantinKai H. KwokHongxiao ShaoCristian CismaruPeter J. Zampardi
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
  • computer aided
  • computer assisted
  • test data
  • fault tree
  • machine learning
  • computer vision
  • object oriented
  • estimation algorithm
  • control system
  • knowledge acquisition
  • power consumption