Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem.
Luigi Ternullo Jr.R. Dean AdamsJohn ConnorGarret S. KochPublished in: ITC (1995)
Keyphrases
- high speed
- random access memory
- low power
- shift register
- memory management
- logic programming
- real time
- memory usage
- high speed networks
- multi valued
- embedded systems
- frame rate
- modal logic
- parallel processing
- memory requirements
- statistical tests
- computational power
- computing power
- main memory
- test cases
- computer systems
- embedded processors
- neural network