Setup for an Experimental Study of Radiation Effects in 65nm CMOS.

Bernhard Fritz Andreas Steininger Václav Simek Varadan Savulimedu Veeravalli

Published in: DSD (2017)

Keyphrases

infrared
high speed
cmos technology
silicon on insulator
information retrieval
x ray
power consumption
database
learning environment
low power
nm technology
social networks
low cost
circuit design
focal plane
metal oxide semiconductor