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In situ strain measurement in the chip formation zone during orthogonal cutting.
Eckart Uhlmann
Robert Gerstenberger
Stefan Herter
T. Hoghé
Walter Reimers
Bettina Camin
R. V. Martins
Andreas Schreyer
Torben Fischer
Published in:
Prod. Eng. (2011)
Keyphrases
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low cost
high speed
high density
analog vlsi
data sets
measurement error
wireless sensor networks
single chip
physical design
vlsi design
solid models