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In situ strain measurement in the chip formation zone during orthogonal cutting.

Eckart UhlmannRobert GerstenbergerStefan HerterT. HoghéWalter ReimersBettina CaminR. V. MartinsAndreas SchreyerTorben Fischer
Published in: Prod. Eng. (2011)
Keyphrases
  • low cost
  • high speed
  • high density
  • analog vlsi
  • data sets
  • measurement error
  • wireless sensor networks
  • single chip
  • physical design
  • vlsi design
  • solid models