• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Unified STIL Flow: A Test Pattern Validation Approach for Compressed Scan Designs.

Slimane BoutobzaAndrea CostaSorin Popa
Published in: EWDTS (2019)
Keyphrases
  • data compression
  • pattern matching
  • test data
  • image processing
  • data structure
  • pattern detection
  • database
  • neural network
  • computer vision
  • clustering algorithm
  • image compression
  • statistical significance
  • flow patterns