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Statistical circuit performance variability minimization under manufacturing variations.

Ayhan A. MutluCharles KwongAbir MukherjeeMahmud Rahman
Published in: ISCAS (2006)
Keyphrases
  • intra personal
  • high speed
  • objective function
  • statistical analysis
  • shape variations
  • manufacturing systems
  • circuit design
  • data driven
  • statistical tests
  • statistical information
  • intra class