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A Rare Event Based Yield Estimation Methodology for Analog Circuits.
Izel Cagin Odabasi
Mustafa Berke Yelten
Engin Afacan
I. Faik Baskaya
Ali Emre Pusane
Günhan Dündar
Published in:
DDECS (2018)
Keyphrases
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analog circuits
fault diagnosis
digital circuits
wavelet packet transform
neural network
estimation accuracy
real time
estimation algorithm
artificial intelligence
image processing
design methodology
estimation process
rare events