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Performance bound and yield analysis for analog circuits under process variations.

Xuexin LiuAdolfo Adair Palma-RodriguezSantiago Rodriguez-ChavezSheldon X.-D. TanEsteban Tlelo-CuautleYici Cai
Published in: ASP-DAC (2013)
Keyphrases
  • analog circuits
  • image processing
  • worst case
  • real time
  • machine learning
  • artificial intelligence
  • image analysis
  • np complete
  • quantitative analysis