Login / Signup
Performance bound and yield analysis for analog circuits under process variations.
Xuexin Liu
Adolfo Adair Palma-Rodriguez
Santiago Rodriguez-Chavez
Sheldon X.-D. Tan
Esteban Tlelo-Cuautle
Yici Cai
Published in:
ASP-DAC (2013)
Keyphrases
</>
analog circuits
image processing
worst case
real time
machine learning
artificial intelligence
image analysis
np complete
quantitative analysis