Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features.

Sahil Sikka Karan Sikka Manas Kamal Bhuyan Yuji Iwahori

Published in: CoRR (2013)

Keyphrases

wavelet features
defect classification
wavelet transform
feature extraction
shift invariant
texture features
multiscale
image compression
motion detection
object detection
gabor features