Inspection of microchip mounting tolerances by 3D vision.

Stefan Behler Martin von Arx

Published in: Three-Dimensional Image Capture and Applications (2008)

Keyphrases

computer vision
vision system
automatic inspection
integrated circuit
image processing
defect detection
reinforcement learning
data structure
computational vision
active vision
relational databases
information technology
database
wide range
decision making
databases
real time