Statistical Testing of a Chaos Based CMOS True-Random Number Generator.

Fabio Pareschi Gianluca Setti Riccardo Rovatti

Published in: J. Circuits Syst. Comput. (2010)

Keyphrases

random number generator
random number
high speed
statistical tests
statistical analysis
power consumption
circuit design
power supply
similarity measure
test cases
statistical models
information theoretic
fingerprint authentication