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A Variation-Tolerant Bitline Leakage Sensing Scheme for Near-Threshold SRAMs.

Lih-Yih ChiouChi-Ray HuangChang-Chieh ChengJing-Yu HuangWei-Suo Ling
Published in: VLSI-DAT (2019)
Keyphrases
  • classification scheme
  • databases
  • detection scheme
  • recognition scheme
  • real world
  • website
  • multiresolution
  • sensor networks
  • sensing devices