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Deep-Learning-Enabled Automatic Optical Inspection for Module-Level Defects in LCD.
Haidi Zhu
Jingchang Huang
Huawei Liu
Qianwei Zhou
Jianqing Zhu
Baoqing Li
Published in:
IEEE Internet Things J. (2022)
Keyphrases
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deep learning
printed circuit boards
defect detection
unsupervised learning
unsupervised feature learning
machine learning
automated visual inspection
mental models
liquid crystal displays
pattern recognition
object recognition
pairwise
deep architectures