A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance.
Keith A. BowmanJames W. TschanzShih-Lien LuPaolo A. AseronMuhammad M. KhellahArijit RaychowdhuryBibiche M. GeuskensCarlos TokunagaChris WilkersonTanay KarnikVivek K. DePublished in: IEEE J. Solid State Circuits (2011)