Drift compensation for automatic nanomanipulation with scanning probe microscopes.

Babak Mokaberi Aristides A. G. Requicha

Published in: IEEE Trans Autom. Sci. Eng. (2006)

Keyphrases

semi automatic
image processing
fully automatic
machine learning
structured light
database
information retrieval
three dimensional
objective function
computational complexity
relational databases
labor intensive
scan data
topic drift
fundamental limits