A Two-Stage-Classifier for Defect Classification in Optical Media Inspection.
Daniel TothAlexandru ConduracheTil AachPublished in: ICPR (4) (2002)
Keyphrases
- defect classification
- multimedia
- training data
- printed circuit boards
- classification scheme
- classification process
- training set
- feature set
- learning algorithm
- feature selection
- nearest neighbor classifier
- classifier systems
- classification method
- training examples
- data sets
- learning classifier systems
- feature space
- digital media
- class labels
- training samples
- classification rate
- linear classifiers
- binary classifiers
- cross media
- automatic inspection
- input data