GLCM-based chi-square histogram distance for automatic detection of defects on patterned textures
V. AshaNagappa U. BhajantriP. NagabhushanPublished in: CoRR (2012)
Keyphrases
- automatic detection
- chi square
- gray level
- texture features
- defect detection
- logistic regression
- gray level co occurrence matrix
- information gain
- texture images
- distance measure
- kl divergence
- texture descriptors
- mutual information
- correlation coefficient
- euclidean distance
- texture analysis
- information theoretic
- mahalanobis distance
- gabor filters
- multiscale
- feature set
- term frequency
- similarity measure
- feature extraction
- decision trees