On Hamming Product Codes With Type-II Hybrid ARQ for On-Chip Interconnects.

Bo Fu Paul Ampadu

Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2009)

Keyphrases

type ii
type i error
high speed
low cost
power dissipation
neyman pearson
error detection
error correction
product design
cmos technology
high density
distance measure
active learning