A Comparative Analysis of 65nm CMOS SRAM and Commercial SRAMs in Security Vulnerability Evaluation.
Weng-Geng HoZixian ZhengKwen-Siong ChongBah-Hwee GweePublished in: DSL (2018)
Keyphrases
- power consumption
- cmos technology
- security vulnerabilities
- information security
- low power
- low cost
- intrusion detection
- security issues
- nm technology
- buffer overflow
- random access memory
- circuit design
- statistical databases
- access control
- high speed
- power supply
- security problems
- evaluation method
- network security
- penetration testing