A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices.
Reza M. RadMohammad TehranipoorPublished in: DFT (2006)
Keyphrases
- objective function
- high accuracy
- detection method
- significant improvement
- experimental evaluation
- computational cost
- mutual information
- evaluation method
- data sets
- high precision
- mathematical model
- synthetic data
- clustering method
- main contribution
- cost function
- support vector machine svm
- computationally efficient
- edge detection
- segmentation method
- preprocessing
- fully automatic
- computational complexity