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Comparative analysis of parameter extraction techniques for AlGaN/GaN HEMT on silicon/sapphire substrate.
Shubhankar Majumdar
Ankush Bag
Dhrubes Biswas
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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comparative analysis
semiconductor devices
semi quantitative
parameter values
low cost
real time
fusion scheme
knowledge extraction
information extraction
computer simulation
high speed
edge detection
input parameters
automatically extracting
color images
image processing
database
silicon dioxide