Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography.
Muhammad Faizan ShiraziKibeom ParkRuchire Eranga WijesingheHyosang JeongSangyeob HanPilun KimMansik JeonJeehyun KimPublished in: Sensors (2016)
Keyphrases
- thin film
- optical coherence tomography
- white light interferometry
- oct images
- spectral domain
- imaging modalities
- retinal images
- short circuit
- high density
- solar cell
- motion artifacts
- electron microscopy
- cross sections
- coronary artery
- fundus images
- multi layer
- chance discovery
- room temperature
- image processing
- image guided
- medical images
- knowledge discovery