Login / Signup
Electrical properties of carbon nanotube via interconnects for 30 nm linewidth and beyond.
Anshul A. Vyas
Changjian Zhou
Patrick Wilhite
Phillip Wang
Cary Y. Yang
Published in:
Microelectron. Reliab. (2016)
Keyphrases
</>
electrical properties
carbon nanotubes
leakage current
cmos technology
input output
low power
integrated circuit
neural network
fiber optic
carbon dioxide
parallel processing
power consumption
databases
power dissipation
metal oxide semiconductor
silicon nitride