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An efficient DNN splitting scheme for edge-AI enabled smart manufacturing.
Himanshu Gauttam
Kiran Kumar Pattanaik
Saumya Bhadauria
Garima Nain
Putta Bhanu Prakash
Published in:
J. Ind. Inf. Integr. (2023)
Keyphrases
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artificial intelligence
edge detection
edge information
machine learning
ai systems
semiconductor manufacturing
neural network
edge detector
knowledge representation
knowledge based systems
computationally efficient
quality control
training process
detection scheme
manufacturing processes