An Improved CMOS BICS for On-Line Testing.

Yvan Maidon Yann Deval Jean-Baptiste Begueret

Published in: IOLTW (2000)

Keyphrases

software testing
low cost
high speed
hd video
analog vlsi
power consumption
test cases
test set
control system
similarity measure
e learning
databases
multi agent
bayesian networks
database systems
case study
test data
neural network
low voltage
data sets