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An Improved CMOS BICS for On-Line Testing.
Yvan Maidon
Yann Deval
Jean-Baptiste Begueret
Published in:
IOLTW (2000)
Keyphrases
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software testing
low cost
high speed
hd video
analog vlsi
power consumption
test cases
test set
control system
similarity measure
e learning
databases
multi agent
bayesian networks
database systems
case study
test data
neural network
low voltage
data sets