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Synthesis of SEU-tolerant ASICs using concurrent error correction.

Harry HollanderBradley S. CarlsonToby D. Bennett
Published in: Great Lakes Symposium on VLSI (1995)
Keyphrases
  • error correction
  • error detection
  • error correcting
  • data hiding
  • error analysis
  • error control
  • physical design
  • error detection and correction
  • ldpc codes
  • image processing
  • magnetic tape