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Towards Automatic Nanomanipulation: Drift Compensation in Scanning Probe Microscopes.

Babak MokaberiAristides A. G. Requicha
Published in: ICRA (2004)
Keyphrases
  • structured light
  • concept drift
  • drift detection
  • data sets
  • database
  • website
  • multiscale
  • input image
  • scan data