Unsupervised Simultaneous Registration and Exposure Correction.

Pedro M. Q. Aguiar

Published in: ICIP (2006)

Keyphrases

electron beam lithography
semi supervised
unsupervised learning
machine learning
database systems
data driven
database
real time
data sets
real world
pairwise
artificial neural networks
multiresolution
competitive learning
unsupervised manner
unsupervised feature selection