SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories.

Tsu-Wei Tseng Jin-Fu Li

Published in: J. Inf. Sci. Eng. (2011)

Keyphrases

random access
error tolerant
multiview video coding
graph matching
built in self test
associative memory
association patterns
neural network
data structure
integrated circuit
subgraph isomorphism