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Defect Tracing System Based on Orthogonal Defect Classification.

Tiejun PanLeina ZhengChengbin Fang
Published in: CSSE (2) (2008)
Keyphrases
  • defect classification
  • real time
  • data mining
  • defect detection
  • neural network
  • computer vision
  • image processing
  • decision trees
  • special case