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Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model.
Ahcène Bounceur
Salvador Mir
Reinhardt Euler
Kamel Beznia
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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computational model
formal model
parametric models
high level
probabilistic model
management system
parameter estimation
theoretical analysis
theoretical framework
experimental data
decision trees
control system
cost function
mathematical model
estimation process