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Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits.

Wangyang ZhangXin LiFrank LiuEmrah AcarRob A. RutenbarRonald D. Blanton
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • low cost
  • integrated circuit
  • main contribution
  • image analysis
  • virtual environment
  • real time
  • data sets
  • probabilistic model
  • statistical analysis
  • high density
  • statistical inference