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Glamorous Analog Testability - We Already Test them and Ship Them - So What is the Problem?

Mohamed Hafed
Published in: ITC (2004)
Keyphrases
  • test data generation
  • data sets
  • three dimensional
  • low cost
  • machine learning
  • genetic algorithm
  • decision trees
  • objective function
  • multi objective
  • test cases
  • test data