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March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories.

Petru CascavalDoina Cascaval
Published in: Microelectron. J. (2010)
Keyphrases
  • random access
  • probabilistic model
  • management system
  • database
  • neural network
  • data structure
  • super resolution
  • test cases
  • associative memory
  • multi dimensional
  • fault diagnosis
  • model based diagnosis