Efficient Device-Edge Inference for Disaster Classification.
Nathaniel Tan Sze YangMau-Luen ThamSing Yee ChuaYing Loong LeeYasunori OwadaSuvit PoomrittigulPublished in: ICUFN (2022)
Keyphrases
- pattern recognition
- classification scheme
- probabilistic inference
- image classification
- decision trees
- cost effective
- classification accuracy
- benchmark datasets
- automatic classification
- pattern classification
- decision support system
- edge detection
- feature selection
- class labels
- classification models
- decision rules
- classification method
- unsupervised learning
- neural network
- support vector machine
- feature extraction
- text classification
- classification systems
- inference process
- classification algorithm
- remote sensing
- machine learning algorithms
- supervised learning
- high dimensional
- training set
- bayesian networks
- image segmentation
- machine learning