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Constrained Empirical Risk Minimization Framework for Distance Metric Learning.

Wei BianDacheng Tao
Published in: IEEE Trans. Neural Networks Learn. Syst. (2012)
Keyphrases
  • distance metric learning
  • distance metric
  • metric learning
  • semi supervised
  • empirical risk minimization
  • feature extraction
  • optimal solution
  • np hard
  • image classification