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Stochastic Testing Simulator for Integrated Circuits and MEMS: Hierarchical and Sparse Techniques.
Zheng Zhang
Xiu Yang
Giovanni Marucci
Paolo Maffezzoni
Ibrahim M. Elfadel
George E. Karniadakis
Luca Daniel
Published in:
CoRR (2014)
Keyphrases
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integrated circuit
monte carlo
hierarchical structure
sparse data
stochastic optimization
high dimensional
electron beam
coarse to fine
simulation model
hierarchical model
sparse matrix
data sets
compressed sensing
dictionary learning
hierarchical clustering
test cases
multiscale