Optimal testing of VLSI analog circuits.

Chieh-Yuan Chao Hung-Jen Lin L. Miler

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)

Keyphrases

analog circuits
optimal solution
digital circuits
neural network
signal processing
lower bound
np hard
worst case
low cost
test cases
software systems
matching algorithm
optimal control
fuzzy neural network
vlsi circuits