Fast Methods for Switch-Level Verification of MOS Circuits.

Douglas S. Reeves Mary Jane Irwin

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1987)

Keyphrases

significant improvement
benchmark datasets
image segmentation
computational cost
computationally expensive
machine learning
bayesian networks
multiscale
preprocessing
probabilistic model
high dimensional data
levels of abstraction
methods require