Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding.
Dong XiangXiaoqing WenLaung-Terng WangPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
- low power
- pseudorandom
- high speed
- power consumption
- low cost
- random number
- built in self test
- uniformly distributed
- single chip
- secret key
- digital signal processing
- low power consumption
- high power
- wireless transmission
- logic circuits
- image sensor
- ultra low power
- gate array
- integrated circuit
- vlsi circuits
- vlsi architecture
- power dissipation